Comparative study of the ToF-SIMS, FT-IR and XPS techniques for quantitative analyses of mixed self-assembled monolayers

Author

Jin Gyeong Son, Hyun Kyong Shon, Changrok Choi, Sang Woo Han, and Tae Geol Lee*

Journal

Surf. Interface Anal.

Vol

46

Page

110-114

Year

2014

Link

https://analyticalsciencejournals.onlinelibrary.wiley.com/doi/full/10.… 589회 연결